The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 1987

Filed:

Mar. 28, 1985
Applicant:
Inventors:

Paul Finer, Roslyn Heights, NY (US);

Robert O Wahl, Sound Beach, NY (US);

William Silverman, Melville, NY (US);

Assignee:

UPA Technology, Inc., Syosset, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01B / ; G01D / ;
U.S. Cl.
CPC ...
378207 ; 378 56 ; 378 48 ; 378 50 ;
Abstract

Improved calibration standard construction for X-ray fluorescence thickness measurement gauges formed of one or more plated layers of known character and thickness disposed on an apertured supporting foil base and accessible to X-radiation through an aperture at the base of a conically shaped bore in a surrounding protective housing member.


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