Syosset, NY, United States of America

Murray Weiser


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Murray Weiser: Innovator in X-ray Technology

Introduction: Murray Weiser is a notable inventor based in Syosset, NY, known for his contributions to the field of precision measurement technology. With a focus on enhancing the capabilities of X-ray fluorescence, his innovative work has resulted in a significant patent that improves measurement accuracy and safety.

Latest Patents: Murray Weiser holds a patent for an X-ray fluorescence thickness measuring device. This device features an advanced primary X-ray beam collimation and workpiece positioning system, which notably increases the detection of fluorescent X-radiation from various specimen calibration standards and workpieces being measured. One of the key elements of this invention is its optical viewing system, which provides a video signal image of the specimen surface, allowing for safe radiation application without hazard to the operator. Additionally, the device ensures precise and repeatable positioning of the selected collimator, optimizing the X-ray beam transmission.

Career Highlights: Throughout his career, Murray has made significant strides in the field of X-ray technology. His invention not only demonstrates his technical expertise but also reflects his commitment to enhancing measurement precision and operator safety in industrial applications. Working with Upa Technology, Inc., he has contributed to advancements that benefit various sectors relying on accurate material assessments.

Collaborations: Murray Weiser has collaborated with talented professionals such as William Silverman and Zvi Landau. These partnerships have been instrumental in fostering a creative environment where innovative solutions can develop, further enhancing the capabilities of the technologies in which they specialize.

Conclusion: Murray Weiser is an accomplished inventor whose work in X-ray fluorescence thickness measuring technology has made a lasting impact. His dedication to improving measurement techniques has not only advanced the field but also paved the way for safer practices in materials analysis. As innovations continue to emerge, the contributions of inventors like Weiser remain vital to the ongoing evolution of technology.

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