Upa Technology, Inc.

Murray Weiser

William Silverman

Paul Finer

Cary I Pincus

Zvi Landau

An X-ray fluorescence thickness measuring devise includes a primary X-ray beam collimation and workpiece positioning system that markedly increases the detectable fluorescent X-radiation from diverse specimen calibration standards and workpieces subjected to measurement. The positioning system includes an optical viewing system that provides a video signal image of the specimen surface prior to and during specimen radiation without hazard to the unit operator and independent of the collimator bore selected. A further feature of the measuring device is that it includes a system which assures repetitive and accurate positioning of a selected collimator relative to the axis of the X-ray beam to obtain maximum beam transmission therethrough.

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Syosset, NY, United States of America

Murray Weiser