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USPTO Data Jan 1 1976 - Oct 27 2026
10 Patents
#74 in Vienna
#319 in Austria
#56,119 in the World
Ims-Ionen Mikrofabrikations Systeme Gmbh
Forward Citations = 134
17 inventors:
Ims-Ionen Mikrofabrikations Systeme Gmbh
Calculating rank
Forward Citations = 134
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17 inventors (with patents filed for the assignee):
Gerhard Stengl (6 out of 37 patents)
Alfred Chalupka (5 out of 17 patents)
Hans Loschner (4 out of 18 patents)
4. Ivaylo W Rangelow (3 out of 3 patents)
5. Elmar Platzgummer (2 out of 55 patents)
6. Hans Loeschner (2 out of 6 patents)
7. Hans Löschner (1 out of 4 patents)
8. Robert Nowak (1 out of 5 patents)
9. Herbert Buschbeck (1 out of 8 patents)
10. Herbert Vonach (1 out of 10 patents)
11. Gertraud Lammer (1 out of 6 patents)
12. Ernst Haugeneder (1 out of 4 patents)
13. Stefan Eder (1 out of 1 patent)
14. Ernst Hammel (1 out of 1 patent)
15. Peter Hudek (1 out of 1 patent)
10 patents:
Company Overview
Ims-Ionen Mikrofabrikations Systeme GmbH is a specialized company based in Vienna, Austria, focusing on advanced ion beam technology for microfabrication applications. The organization develops innovative solutions for the semiconductor industry, particularly in the areas of ion implantation and surface modification. By leveraging cutting-edge research and technology, Ims-Ionen Mikrofabrikations Systeme GmbH plays a crucial role in enhancing the precision and efficiency of microelectronic device manufacturing, contributing to advancements in various high-tech sectors.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Ims-Ionen Mikrofabrikations Systeme Gmbh. Retrieved from https://idiyas.com/company/ims-ionen-mikrofabrikations-systeme
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]