Vienna, Austria

Stefan Eder


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: The Innovations of Stefan Eder

Introduction

Stefan Eder is a notable inventor based in Vienna, Austria. He has made significant contributions to the field of particle projection lithography. His innovative work has led to the development of a unique patent that enhances the precision of alignment systems in lithography processes.

Latest Patents

Stefan Eder holds a patent for a "Pattern lock system." This invention involves an alignment system that determines alignment parameters to measure the position and shape of an optical image of a pattern of structures formed in a mask. The system utilizes a broad particle beam and an apparatus with multiple alignment marks that produce secondary radiation upon irradiation. The alignment marks are strategically positioned outside the aperture of the alignment system, allowing for variations along the optical axis. This design improves the accuracy of the imaging process onto the target.

Career Highlights

Stefan Eder is associated with Ims-Ionen Mikrofabrikations Systeme GmbH, where he applies his expertise in microfabrication technologies. His work focuses on advancing the capabilities of lithography systems, which are crucial in various manufacturing processes.

Collaborations

Stefan has collaborated with notable colleagues, including Alfred Chalupka and Gerhard Stengl. Their combined efforts contribute to the innovative advancements in their field.

Conclusion

Stefan Eder's contributions to the field of particle projection lithography through his patent and collaborative efforts highlight his role as a significant inventor. His work continues to influence advancements in microfabrication technologies.

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