For the Inventor, By the Inventor

Enter assignee name

Hitachi High-Tech Analysis Corporation

USPTO Granted Patents = 3

EPO Patents = 1

Forward Citations = 0

Loading Chart...

Loading Chart...

12 inventors (with patents filed for the assignee):

Takuya Kambayashi (1 out of 15 patents)

Akihiro Nojima (1 out of 15 patents)

Jun Horigome (1 out of 8 patents)

4. Tsuneo Sato (1 out of 48 patents)

5. Yusuke Kaga (1 out of 4 patents)

6. Toshiyuki Takahara (1 out of 17 patents)

7. Satoshi Matsubara (1 out of 21 patents)

8. Takashi Takahama (1 out of 6 patents)

9. Kai Maruyama (1 out of 4 patents)

10. Kazuya Iwata (1 out of 2 patents)

11. Yuta Seki (1 out of 1 patent)

12. Kazuyuki Hozawa (1 out of 1 patent)

3 patents: Sort by Forward Citations

1. 12523620 - X-ray inspection apparatus and method of inspection with X-rays (2026-01-13),

2. 12471392 - Semiconductor detector and method of manufacturing same (2025-11-11),

3. 12399063 - Spectroscopic analysis system and spectroscopic analysis method (2025-08-26),

Company Badge

USPTO Data Jan 1 1976 - Jan 13 2026

3 Patents

#3,264 in Tokyo

#8,774 in Japan

Hitachi High-Tech Analysis Corporation

Forward Citations = 0

12 inventors:

Takuya Kambayashi (1 out of 15 patents)

Akihiro Nojima (1 out of 15 patents)

Jun Horigome (1 out of 8 patents)

4. Tsuneo Sato (1 out of 48 patents)

5. Yusuke Kaga (1 out of 4 patents)

Please report any incorrect information to support@idiyas.com

Loading…