EPO Patents = 1

Forward Citations = 0

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17 inventors (with patents filed for the assignee):

Tsuneo Sato (2 out of 49 patents)

Toshiyuki Takahara (2 out of 18 patents)

Satoshi Matsubara (2 out of 23 patents)

4. Kazuya Iwata (2 out of 3 patents)

5. Yuta Seki (2 out of 2 patents)

6. Takuya Kambayashi (1 out of 15 patents)

7. Akihiro Nojima (1 out of 17 patents)

8. Jun Horigome (1 out of 8 patents)

9. Masato Fukuda (1 out of 7 patents)

10. Tatsuya Asahata (1 out of 54 patents)

11. Yusuke Kaga (1 out of 4 patents)

12. Takashi Takahama (1 out of 6 patents)

13. Kai Maruyama (1 out of 4 patents)

14. Yui Okano (1 out of 1 patent)

15. Masahito Ito (1 out of 1 patent)

8 patents: Sort by Forward Citations

1. 12725755 - Sample piece relocating device (2026-09-01),

2. 12638370 - Sample container and dynamic mechanical analyzer using the same (2026-05-26),

3. 12631574 - X-ray transmission inspection apparatus and X-ray transmission inspection method (2026-05-19),

4. 12631573 - X-ray inspection apparatus and method of inspection with X-rays (2026-05-19),

5. 12571780 - Data processing device for chromatograph, data processing method, and chromatograph (2026-03-10),

6. 12523620 - X-ray inspection apparatus and method of inspection with X-rays (2026-01-13),

7. 12471392 - Semiconductor detector and method of manufacturing same (2025-11-11),

8. 12399063 - Spectroscopic analysis system and spectroscopic analysis method (2025-08-26),

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

8 Patents

#2,150 in Tokyo

#5,045 in Japan

Tokyo, Japan

Hitachi High-Tech Analysis Corporation

Forward Citations = 0

17 inventors:

Tsuneo Sato (2 out of 49 patents)

Toshiyuki Takahara (2 out of 18 patents)

Satoshi Matsubara (2 out of 23 patents)

4. Kazuya Iwata (2 out of 3 patents)

5. Yuta Seki (2 out of 2 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hitachi High-Tech Analysis Corporation. Retrieved from https://idiyas.com/company/hitachi-high-tech-analysis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]