Hirohito Fujiwara

USPTO Granted Patents = 11 (Patent Applications = 1)

Average Co-Inventor Count = 2.2

ph-index = 2

Forward Citations = 22(Granted Patents)

Location History:

Chiba, JP (2012 - 2015)
Tokyo, JP (2016 - 2022)

Company Filing History:

7 out of 223

Hitachi High-tech Science Corporation

patents

2 out of 2,899

Seiko Instruments Inc

patents

2 out of 223

Sii Nanotechnology Inc.

patents

Years Active: 2012-2025

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11 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12320740 - Apparatus for acquiring polarized images (2025-06-03),

2. 11460425 - Thermal analyzer (2022-10-04),

3. 9885645 - Thermal analyzer (2018-02-06),

4. 9753509 - Imaging apparatus for thermal analyzer and thermal analyzer including the same (2017-09-05),

5. D758221 - Thermogravimetric analyzer (2016-06-07),

6. D747227 - Thermogravimetric analyzer (2016-01-12),

7. 8978479 - Viscoelasticity measuring apparatus (2015-03-17),

8. 8708556 - Thermal analyzer (2014-04-29),

9. 8342744 - Differential scanning calorimeter (2013-01-01),

10. 8156853 - Automatic thin-section manufacturing system (2012-04-17),

11. 8087334 - Sectioning instrument (2012-01-03),

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1 patent pending:

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