The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Jan. 06, 2023
Hitachi High-tech Science Corporation, Tokyo, JP;
Hirohito Fujiwara, Tokyo, JP;
Ryokuhei Yamazaki, Tokyo, JP;
HITACHI HIGH-TECH SCIENCE CORPORATION, Tokyo, JP;
Abstract
Disclosed is an apparatus for acquiring polarized images attached to a thermal analysis apparatus including a pair of sample containers housing a measurement sample and a reference sample, respectively, and a heating furnace, configured to observe at least the measurement sample through a window or an opening of the heating furnace, and including an attachment section attached to the thermal analysis apparatus, a light source, a polarizer configured to polarize light emitted from the light source, a camera and an analyzer polarize light reflected from the measurement sample or the reference sample to enter the camera after the measurement sample or the reference sample is irradiated via the window or the opening with polarized light transmitted through the polarizer. A first optical path of the polarizer and a second optical path of the analyzer are not parallel, and both the polarizer and the analyzer are rotatable.