The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Dec. 22, 2020
Applicant:

Hitachi High-tech Science Corporation, Tokyo, JP;

Inventors:

Kengo Kobayashi, Tokyo, JP;

Shinya Nishimura, Tokyo, JP;

Hirohito Fujiwara, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/20 (2006.01); G01N 25/02 (2006.01);
U.S. Cl.
CPC ...
G01N 25/20 (2013.01); G01N 25/02 (2013.01);
Abstract

Provided is a thermal analyzer, with which a sample can be observed even under a state in which a heat sink is cooled to a room temperature or lower. The thermal analyzer includes: the heat sink, in which a measurement sample container and a reference sample container are placed; a heat sink cover configured to cover the heat sink; a heat sink window provided in the heat sink; a heat sink cover window provided in the heat sink cover; an imaging device configured to image the sample in the heat sink through the heat sink window and the heat sink cover window; a purge gas introduction portion, through which a purge gas is introduced into the heat sink; and a discharge port, through which the purge gas is allowed to flow from one of the heat sink window and the heat sink to a space inside the heat sink cover.


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