The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Feb. 22, 2012
Nobuaki Okubo, Chiba, JP;
Kengo Kobayashi, Chiba, JP;
Toshihiko Nakamura, Chiba, JP;
Hirohito Fujiwara, Chiba, JP;
Nobuaki Okubo, Chiba, JP;
Kengo Kobayashi, Chiba, JP;
Toshihiko Nakamura, Chiba, JP;
Hirohito Fujiwara, Chiba, JP;
Hitachi High-Tech Science Corporation, Tokyo, JP;
Abstract
Provided is a viscoelasticity measuring apparatus in which an undesirable sample shape change such as a buckle caused as a result of thermal expansion of a sample is eliminated so as to prevent a deformation in a displacement detector direction due to the thermal expansion and a bending of the sample between a sample grasping member and a chuck, to thereby improve accuracy of measurement. In the viscoelasticity measuring apparatus, a thin part is provided in a part of an elastic arm for holding the sample so as to be easily deformed by a thermal expansion force of the sample. Thus, an undesirable shape change such as the buckle generated when the sample is expanded thermally is effectively eliminated, and necessary stiffness is maintained with respect to a load of the sample and hence accuracy of measurement is improved.