The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 26, 2025
Filed:
Jun. 28, 2023
Hitachi High-tech Science Corporation, Tokyo, JP;
Akihiro Nojima, Tokyo, JP;
Yusuke Kaga, Tokyo, JP;
Takuya Kambayashi, Tokyo, JP;
Jun Horigome, Tokyo, JP;
Kai Maruyama, Tokyo, JP;
HITACHI HIGH-TECH ANALYSIS CORPORATION, Tokyo, JP;
Abstract
A spectroscopic analysis system includes: an operation panel configured to receive an input of at least one of an upper limit value of a measurement period of a spectroscopic analysis spectrum or a lower limit value of measurement accuracy as a user setting condition related to measurement of the spectroscopic analysis spectrum of a sample; and a control unit configured to derive a predetermined recommended measurement condition that satisfies the user setting condition and cause a display unit to display the recommended measurement condition, in which the recommended measurement condition is at least one of a wavelength range of light to be used for measurement of the spectroscopic analysis spectrum, a sampling interval of a wavelength of the light, a slit width of a diffraction grating of a spectroscope that disperses the light, or a sweep speed of the wavelength of the light.