The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Apr. 21, 2023
Hitachi High-tech Analysis Corporation, Tokyo, JP;
Toshiyuki Takahara, Tokyo, JP;
Tsuneo Sato, Tokyo, JP;
Satoshi Matsubara, Tokyo, JP;
Yuta Seki, Tokyo, JP;
Kazuya Iwata, Tokyo, JP;
HITACHI HIGH-TECH ANALYSIS CORPORATION, Tokyo, JP;
Abstract
Proposed are an X-ray inspection apparatus and a method of inspection with X-rays in which even in a sample having coated portion and uncoated portion of the cathode material, the inspection of foreign objects in the both portions can be simultaneously performed under the same conditions. The X-ray inspection apparatus includes an X-ray source () that irradiates the sample (S) with X-rays (X), an X-ray detection unit () which is installed at a side opposite to the X-ray source with respect to the sample and detects the X-rays that passed through the sample, and a filter () installed between the X-ray source and the X-ray detection unit, wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption.