The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
May. 18, 2023
Hitachi High-tech Analysis Corporation, Tokyo, JP;
Yui Okano, Tokyo, JP;
Nobuaki Okubo, Tokyo, JP;
HITACHI HIGH-TECH ANALYSIS CORPORATION, Tokyo, JP;
Abstract
In measuring dynamic viscoelasticity, a problem that a viscous fluid sample such as polymer melt index, thermosetting resin, adhesive, or paint cannot be measured for dynamic viscoelasticity can be solved. Disclosed is a sample containerused to measure dynamic viscoelasticity according to temperature changes occurring when heating or cooling a sample. The sample containerincludes a lower-end-closed sample cup with an opening at an upper end, and an insertion jighaving a cross section smaller in area than the opening of the sample cup, being insertable into the sample cupthrough the opening, and being capable of transferring vibration to a sample contained in the sample cup