Tokyo, Japan

Nobuaki Okubo

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Analysis Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Nobuaki Okubo. Retrieved from https://idiyas.com/inventor/nobuaki-okubo-8a7u4s3d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Nobuaki Okubo and Dynamic Mechanical Analysis

Introduction

Nobuaki Okubo is an inventor associated with Tokyo, Japan, and Hitachi High-Tech Analysis Corporation. His patent work addresses the measurement of dynamic viscoelasticity in viscous materials.

Latest Patents

The provided information lists 1 patent for Okubo: “Sample Container and Dynamic Mechanical Analyzer Using the Same.” The invention describes a container for measuring changes in a sample’s dynamic viscoelasticity as it is heated or cooled. It includes a sample cup closed at the bottom and open at the top, along with an insertion jig that fits through the opening and can transfer vibration to the sample. This design is intended to enable measurements of viscous samples, including polymer melts, thermosetting resins, adhesives, and paints.

Career Highlights

Okubo’s listed patent focuses on addressing a measurement challenge in dynamic mechanical analysis: obtaining dynamic viscoelasticity data from viscous fluid samples. The disclosed container and analyzer arrangement is designed to support testing across temperature changes.

Collaborations

The provided information identifies Yui Okano as Okubo’s coworker. It does not specify whether Okano collaborated with him on the patent.

Conclusion

Nobuaki Okubo’s listed invention concerns a sample-container design intended to make dynamic viscoelasticity measurements possible for viscous materials under changing temperatures.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…