logo

For the Inventor, By the Inventor

Shenzhen, China

General Test Systems Inc.

Calculating rank
USPTO Granted Patents = 13


Forward Citations = 33

Loading Chart...
Loading Chart...

6 inventors (with patents filed for the assignee):

goldMedal Yihong Qi (12 out of 14 patents)

silverMedal Wei Yu (11 out of 85 patents)

bronzeMedal Penghui Shen (7 out of 7 patents)

4.  Jun Fan (1 out of 4 patents)

5.  Qingchun Luo (1 out of 1 patent)

6.  Bo Liu (1 out of 36 patents)


13 patents:

1. 11962357 - Method and system for testing wireless performance of wireless terminal (2024-04-16),
2. 11876568 - Radio frequency performance testing method and apparatus of wireless device, and tester (2024-01-16),
3. 11601207 - Method for measuring power of non-constant envelope modulated signal, and electronic device (2023-03-07),
4. 11558131 - Method and apparatus for measuring wireless performance of receiver of wireless terminal (2023-01-17),
5. 11422176 - Method and device for measuring radiation pattern of antenna array, and computer readable storage medium (2022-08-23),
6. 11061428 - Method and device for reconstructing field source of array antenna based on dipoles (2021-07-13),
7. 10797808 - Method for testing wireless performance of MIMO wireless terminal (2020-10-06),
8. 10416214 - System for testing wireless terminal and method for controlling the same (2019-09-17),
9. 10302685 - Measurement system (2019-05-28),
10. 10256923 - Method and device for generating MIMO test signal (2019-04-09),
11. 10012683 - System for testing wireless terminal and method for controlling same (2018-07-03),
12. 9964577 - Wireless terminal testing system (2018-05-08),
13. 9614627 - Method and device for testing performance of wireless terminal (2017-04-04),
Company Overview
General Test Systems Inc. is a technology company based in Shenzhen, China, specializing in advanced testing and measurement solutions. The organization focuses on developing innovative systems for various applications, including electronics, telecommunications, and industrial automation. With a commitment to quality and precision, General Test Systems aims to enhance product reliability and performance through its cutting-edge technologies and comprehensive testing services, catering to a diverse range of industries globally.
Profile summary synthesized from public USPTO records and patent filings.

logo

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

13 Patents

#345 in Shenzhen

#2,203 in China

#45,104 in the World

Shenzhen, CN
Shenzhen, China

General Test Systems Inc.

Forward Citations = 33

6 inventors:

goldMedal Yihong Qi (12 out of 14 patents)

silverMedal Wei Yu (11 out of 85 patents)

bronzeMedal Penghui Shen (7 out of 7 patents)

4.  Jun Fan (1 out of 4 patents)

5.  Qingchun Luo (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: General Test Systems Inc.. Retrieved from https://idiyas.com/company/general-test-systems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…