The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Mar. 24, 2016
Applicant:

General Test Systems Inc., Shenzhen, CN;

Inventors:

Yihong Qi, Shenzhen, CN;

Wei Yu, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H04B 17/00 (2015.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01); G01R 29/08 (2013.01); G01R 29/0821 (2013.01); G01R 29/105 (2013.01);
Abstract

Disclosed are a system for testing a wireless terminal and a method for controlling the same. The system includes: a reflecting surface, configured to totally reflect one or more first wireless signals emitted by the wireless terminal; a test antenna, configured to receive the one or more first wireless signals reflected by the reflecting surface; and an absorbing screen, configured to absorb one or more second wireless signals emitted by the wireless terminal. The device under test, the test antenna and the reflecting surface correspond to a same ellipsoid, the device under test and the test antenna are arranged at two foci of the ellipsoid respectively, the reflecting surface is arranged on the ellipsoidal surface and the absorbing screen is arranged on a straight line between the device under test and the test antenna.


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