The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

May. 26, 2021
Applicant:

General Test Systems Inc., Guangdong, CN;

Inventors:

Yihong Qi, Guangdong, CN;

Wei Yu, Guangdong, CN;

Penghui Shen, Guangdong, CN;

Assignee:

GENERAL TEST SYSTEMS INC., Guangdong, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 7/0413 (2017.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 7/0413 (2013.01); H04B 17/29 (2015.01);
Abstract

The present disclosure provides a method and system for testing wireless performance of a wireless terminal configured as a DUT having multiple transmitting antennas and placed in an anechoic chamber. The method includes: obtaining antenna pattern of the multiple transmitting antennas, and importing the antenna pattern into a channel emulator; selecting a same number of testing antennas in the anechoic chamber as a number of the transmitting antennas; the selected testing antennas receiving a signal from the transmitting antennas, and sending the signal to the channel emulator, the channel emulator processing the signal to generate an analog signal and sending the analog signal to an analog base station; and the analog base station receiving the analog signal and performing a throughput test to obtain an uplink wireless performance test of the DUT.


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