The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2020

Filed:

Nov. 09, 2017
Applicant:

General Test Systems Inc., Shenzhen, Guangdong, CN;

Inventors:

Yihong Qi, Guangdong, CN;

Penghui Shen, Guangdong, CN;

Assignee:

GENERAL TEST SYSTEMS INC., Shenzhen, Guangdong, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 17/12 (2015.01); H04B 17/21 (2015.01); H04B 7/0413 (2017.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); H04B 7/0413 (2013.01); H04B 17/12 (2015.01); H04B 17/21 (2015.01);
Abstract

A method for testing wireless performance of a MIMO wireless terminal includes: obtaining antenna pattern information of a plurality of antennas of the MIMO wireless terminal tested in an electromagnetic anechoic chamber; further obtaining a test signal according to the antenna pattern information of the MIMO wireless terminal; calibrating the test signal by using an error calibration joint matrix of the MIMO wireless terminal so as to obtain a transmitting signal for testing; and finally feeding the transmitting signal for testing into a plurality of measurement antennas of the electromagnetic anechoic chamber and transmitting the transmitting signal to the wireless terminal through the measurement antennas so as to test the wireless terminal.


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