The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2024

Filed:

Jun. 28, 2021
Applicant:

General Test Systems Inc., Guangdong, CN;

Inventors:

Yihong Qi, Guangdong, CN;

Wei Yu, Guangdong, CN;

Penghui Shen, Guangdong, CN;

Assignee:

GENERAL TEST SYSTEMS INC., Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 17/391 (2015.01); H04B 17/18 (2015.01); H04B 7/0417 (2017.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 7/0417 (2013.01); H04B 17/18 (2015.01); H04B 17/3912 (2015.01); H04W 24/08 (2013.01);
Abstract

A method for testing radio frequency performance of a wireless device is provided. Power level reporting information of a device under test is obtained. A propagation matrix is obtained based on the power level reporting information. An inverse matrix is obtained based on the propagation matrix to form a virtual cable between an output port of an instrument and a receiver port of the device under test. A throughput test signal is transmitted through the virtual cable to perform a performance test on the device under test and to obtain a test result of the radio frequency performance.


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