The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2023
Filed:
Mar. 26, 2021
General Test Systems Inc., Guangdong, CN;
GENERAL TEST SYSTEMS INC., Shenzhen, CN;
Abstract
The disclosure provides a method for measuring a power of a non-constant envelope modulated signal, an electronic device, and a computer readable storage medium. The method includes: sampling baseband I/Q data transmitted by a device under test to obtain sample data, in which a sampling duration is less than a length of a cycle of the non-constant envelope modulated signal; calculating a sample power within the sampling duration based on the sample data; matching in predetermined baseband I/Q data in the cycle based on the sample data to obtain a target baseband I/Q data segment; obtaining a power calibration value corresponding to the target baseband I/Q data segment; and obtaining an actual power of the non-constant envelope modulated signal in the cycle based on the power calibration value corresponding to the target baseband I/Q data segment and the sample power within the sampling duration.