The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Nov. 21, 2018
General Test Systems Inc., Guangdong, CN;
GENERAL TEST SYSTEMS INC., Guangdong, CN;
Abstract
The present disclosure provides a method and a device for measuring a radiation pattern of an antenna array. The method includes: obtaining a plurality of array radiation patterns corresponding to a plurality of array elements and a plurality of center positions corresponding to the plurality of array radiation patterns; feeding a preset port excitation to the antenna array; obtaining a plurality of sets of measurement data of the antenna array at a plurality of corresponding measurement points in a far field of the antenna array; obtaining an aperture field excitation based on the plurality of array radiation patterns, the plurality of center positions, positions of the plurality of measurement points and the plurality of sets of measurement data; and obtaining a radiation pattern of the antenna array at a target position based on the aperture field excitation, the plurality of array radiation patterns and the plurality of center positions.