The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2019
Filed:
Dec. 14, 2017
General Test Systems Inc., Shenzhen, CN;
GENERAL TEST SYSTEMS INC., Shenzhen, CN;
Abstract
A measurement system including an anechoic chamber, a turntable, N measurement antennas, in which N is a natural number and N≥11, in which a spherical coordinate system is established by taking a center of a measured piece as an origin and a coordinates of the i (i=1, 2, 3, . . . , N) measurement antenna is A(ρ, θ, φ), (i=1, 2, 3, . . . , N), in which θis a positive integral multiple of 15°, and at least one measurement antenna is arranged at a position where the angle θis 15°, 30°, 30°, 45°, 60°, 75°, 90°, 105°, 120°, 135°, 150° or 165° correspondingly; and 0≤φ≤360°, and the N measurement antennas are not located in the same plane. The present disclosure can create a measurement environment with small coupling interference and low reflection between the measurement antennas in a relatively small anechoic chamber, improving the measurement accuracy.