The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Apr. 10, 2015
Applicant:

General Test Systems Inc., Shenzhen, Guangdong, CN;

Inventors:

Yihong Qi, Guangdong, CN;

Wei Yu, Guangdong, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); H04B 17/00 (2015.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01);
Abstract

Disclosed are a system for testing a wireless terminal and a method for controlling the same. The system includes: a device under test being a wireless terminal; a reflecting surface, configured to totally reflect one or more wireless signals emitted by the wireless terminal; a rotation mechanism, configured to drive the device under test to rotate; a test antenna, configured to receive one or more wireless signals reflected; and an absorbing screen. The device under test, the test antenna and the reflecting surface correspond to a same ellipsoidal surface, the device under test and the test antenna are arranged at two foci of the ellipsoidal surface respectively, and the reflecting surface is arranged on the ellipsoidal surface. The system has advantages of small repetition error of test results, stable test results, high testing efficiency, and low cost.


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