Fremont, CA, United States of America

Youxian Wen

USPTO Granted Patents = 17 

 

Average Co-Inventor Count = 2.6

ph-index = 7

Forward Citations = 317(Granted Patents)


Location History:

  • Livermore, CA (US) (2002 - 2013)
  • Fremont, CA (US) (2009 - 2017)

Company Filing History:


Years Active: 2002-2017

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17 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Inventor Youxian Wen

Introduction

Youxian Wen, an accomplished inventor based in Fremont, CA, has made significant strides in the field of semiconductor technology. With a remarkable portfolio of 17 patents, Wen's inventions focus on enhancing inspection methodologies in the semiconductor industry, thus improving the accuracy and efficiency of defect detection.

Latest Patents

Among his latest advancements, Wen has developed systems and methods aimed at enhancing the inspection sensitivity of tools used to detect defects in wafers. These technologies employ a combination of light-emitting diodes to illuminate wafer surfaces and capture a series of grayscale images. By determining and subtracting a residual signal from these images, defects can be accurately identified. In another significant patent, Wen introduced a system for semiconductor wafer inspection and metrology, which assesses various attributes of wafer layers, including thickness and surface roughness. The integration of light sources and sensors allows for a detailed analysis of reflected beams, enabling precise measurements through innovative signal normalization techniques.

Career Highlights

Throughout his career, Youxian Wen has collaborated with prominent companies in the semiconductor sector, including Therma-Wave, Inc. and Kla Tencor Corporation. His work has been integral in developing advanced inspection technologies that play a crucial role in the manufacturing processes of semiconductors.

Collaborations

Wen has also worked alongside noteworthy colleagues like Jon Opsal and Shifang Li, contributing to a collaborative environment that fosters innovation in inspection methods for semiconductor wafers. These partnerships have not only enhanced the capabilities of the technologies but have also facilitated knowledge sharing that benefits the industry at large.

Conclusion

Youxian Wen continues to make impactful contributions to the field of semiconductor technology through his inventive spirit and dedication to improving inspection processes. His impressive array of patents underscores the importance of innovation in enhancing the reliability and effectiveness of semiconductor manufacturing. As the technology continues to evolve, Wen's work will undoubtedly leave a lasting legacy in the industry.

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