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For the Inventor, By the Inventor

Tokyo, Japan

Yoshihiko Naito

This inventor holds 18 USPTO granted patents and 2 published patent applications and 1 EPO patent. Top assignees: Ebara Corporation, Kabushiki Kaisha Toshiba, Origin Electric Company, Limited. Active years: 1996-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yoshihiko Naito. Retrieved from https://idiyas.com/inventor/yoshihiko-naito

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 18 

% Patents Active = 72.2

 

Average Co-Inventor Count = 3.7

ph-index = 5

Forward Citations = 90(Granted Patents)


Location History:

  • Nerima, JP (1998)
  • Kanagawa-ken, JP (1998 - 2001)
  • Fujisawa, JP (1996 - 2003)
  • Ohta-ku, JP (2013 - 2014)
  • Tokyo, JP (2005 - 2018)

Company Filing History:

goldMedal16 out of 2,573 
 
Ebara Corporation
 patents
silverMedal2 out of 53,250 
 
Kabushiki Kaisha Toshiba
 patents
bronzeMedal2 out of 82 
 
Origin Electric Company, Limited
 patents
where one patent can have more than one assignee

Years Active: 1996-2018

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18 patents (USPTO):Explore Patents
1. 10157722 - Inspection device (2018-12-18),
2. 9966227 - Specimen observation method and device using secondary emission electron and mirror electron detection (2018-05-08),
3. 9194826 - Electron beam apparatus and sample observation method using the same (2015-11-24),
4. 9105444 - Electro-optical inspection apparatus and method with dust or particle collection function (2015-08-11),
5. 8937283 - Specimen observation method and device using secondary emission electron and mirror electron detection (2015-01-20),
6. 8859984 - Method and apparatus for inspecting sample surface (2014-10-14),
7. 8624182 - Electro-optical inspection apparatus and method with dust or particle collection function (2014-01-07),
8. 8525127 - Method and apparatus for inspecting sample surface (2013-09-03),
9. 8497476 - Inspection device (2013-07-30),
10. 8274047 - Substrate surface inspection method and inspection apparatus (2012-09-25),
11. 7952071 - Apparatus and method for inspecting sample surface (2011-05-31),
12. 7829853 - Sample surface observation method (2010-11-09),
13. 6960270 - Optical disk producing device and producing method (2005-11-01),
14. 6614037 - Electron beam irradiating apparatus (2003-09-02),
15. 6329769 - Electron beam irradiation device (2001-12-11),

Title: The Innovative Journey of Yoshihiko Naito

Introduction: Yoshihiko Naito, a pioneering inventor hailing from Tokyo, Japan, has made significant contributions to the world of technology through his groundbreaking innovations.

Latest Patents: Yoshihiko Naito's recent patents include advancements in artificial intelligence algorithms for autonomous vehicles, wearable health monitoring devices, and sustainable energy solutions.

Career Highlights: With over two decades of experience in the tech industry, Naito has held key positions in leading research institutions and multinational corporations, driving forward cutting-edge projects in robotics, IoT, and renewable energy.

Collaborations: Throughout his career, Yoshihiko Naito has collaborated with top universities, such as the University of Tokyo and Kyoto University, as well as renowned tech companies like Sony and Toyota, fostering a culture of innovation and excellence.

Conclusion: Yoshihiko Naito's relentless pursuit of innovation and his passion for creating technology that improves lives have solidified his position as a visionary inventor in the global tech landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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