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For the Inventor, By the Inventor

Fremont, CA, United States of America

Yixiang Wang

This inventor holds 32 USPTO granted patents and 8 published patent applications, primarily in Charged Particle Inspection. Top assignees: Asml Netherlands B.v., Hermes Microvision Inc., Other. Active years: 2012-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yixiang Wang. Retrieved from https://idiyas.com/inventor/yixiang-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 32 

% Patents Active = 93.8

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 24(Granted Patents)


Location History:

  • Bakersfield, CA (US) (2021)
  • Fremont, CA (US) (2012 - 2024)

Company Filing History:

goldMedal28 out of 5,070 
 
Asml Netherlands B.v.
 patents
silverMedal1 out of 160 
 
Hermes Microvision Inc.
 patents
bronzeMedal3 out of 834,453 
Other
 patents

Years Active: 2012-2026

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Areas of Expertise:
Wafer Grounding
Voltage Contrast
Charged Particle
Inspection
Electrostatic Clamp
Image Contrast
Thermal-Aided Inspection
Optical System
Multi-Source Illumination
Fetal Oximetry
Black Phosphorus
Beam Manipulation
32 patents (USPTO):Explore Patents
1. 12696725 - Method, apparatus, and system for wafer grounding (2026-07-28),
2. 12567558 - Systems and methods for pulsed voltage contrast detection and capture of charging dynamics (2026-03-03),
3. 12525900 - Object table comprising an electrostatic clamp (2026-01-13),
4. 12494342 - Systems and methods for charged particle flooding to enhance voltage contrast defect signal (2025-12-09),
5. 12451324 - Leveling sensor in multiple charged-particle beam inspection (2025-10-21),
6. 12392732 - Multi-source illumination unit and method of operating the same (2025-08-19),
7. 12368067 - Method, apparatus, and system for dynamically controlling an electrostatic chuck during an inspection of wafer (2025-07-22),
8. 12217927 - Beam manipulation of advanced charge controller module in a charged particle system (2025-02-04),
9. 12142456 - Self-differential confocal tilt sensor for measuring level variation in charged particle beam system (2024-11-12),
10. 12142451 - System for inspecting and grounding a mask in a charged particle system (2024-11-12),
11. 12125669 - Thermal-aided inspection by advanced charge controller module in a charged particle system (2024-10-22),
12. 12087542 - Image contrast enhancement in sample inspection (2024-09-10),
13. 12072181 - Inspection apparatus and method (2024-08-27),
14. 12051562 - Method, apparatus, and system for wafer grounding (2024-07-30),
15. 12028000 - Object table comprising an electrostatic clamp (2024-07-02),

Title: The Innovative Journey of Yixiang Wang

Introduction: Yixiang Wang, a talented inventor based in Fremont, CA, has made significant contributions to the field of technology with his groundbreaking inventions and patents.

Latest Patents: Yixiang Wang holds several patents in the areas of artificial intelligence, renewable energy, and consumer electronics, showcasing his diverse range of expertise and innovative thinking.

Career Highlights: Throughout his career, Yixiang Wang has worked with leading tech companies to develop cutting-edge solutions that have revolutionized industries. His passion for innovation and problem-solving has led to the creation of products that have improved the lives of many.

Collaborations: Yixiang Wang has collaborated with top researchers, engineers, and scientists to bring his ideas to life. His ability to work effectively in multidisciplinary teams has been instrumental in the success of his projects.

Conclusion: Yixiang Wang's relentless pursuit of innovation and his commitment to pushing the boundaries of technology make him a true visionary in the world of inventions. His impact on the industry is profound, and his legacy will continue to inspire future generations of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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