Tokyo, Japan

Xin Man

This inventor holds 27 USPTO granted patents and 3 published patent applications and 1 EPO patent, primarily in Charged Particle Beam Technology. Top assignees: Hitachi High-Tech Science Corporation, Sii Nanotechnology Inc.. Active years: 2012-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xin Man. Retrieved from https://idiyas.com/inventor/xin-man

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 27 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.2

ph-index = 3

Forward Citations = 24(Granted Patents)


Location History:

  • Chiba, JP (2012 - 2015)
  • Tokyo, JP (2014 - 2023)

Company Filing History:


Years Active: 2012-2023

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Areas of Expertise:
Charged Particle Beam
Cross-Section Processing
Sample Observation
Focused Ion Beam
Crystal Analysis
Irradiation Apparatus
Sample Preparation
Control Method
Observation Device
Processing Method
Composite Device
27 patents (USPTO):Explore Patents

Title: Innovations by Xin Man: A Leader in Charged Particle Beam Technology

Introduction

Xin Man, based in Tokyo, Japan, is a renowned inventor with a remarkable portfolio of 27 patents. His groundbreaking work primarily focuses on charged particle beam technology, which has significant applications in various scientific and industrial fields.

Latest Patents

Among Xin Man's latest innovations is the "Cross-section observation device and control method." This advanced device utilizes a charged particle beam to repeatedly expose and analyze cross-sections of an object. By bombarding these cross-sections and acquiring detailed cross-sectional image information, the device can generate comprehensive three-dimensional images that depict the internal structure of the object. Furthermore, it displays these images according to different observational conditions, enhancing its versatility and utility.

Another notable patent is the "Charged particle beam irradiation apparatus and control method." This device includes a focused ion beam column and an electron beam column, complemented by an electron detector and an image-forming unit. The control unit facilitates precise exposure control and observation of different layers in a multilayered sample, enabling detailed imaging and analysis of complex materials.

Career Highlights

Xin Man has made significant contributions to his field while working with renowned companies such as Hitachi High-Tech Science Corporation and Sii Nanotechnology Inc. His expertise has propelled advancements in the understanding and application of charged particle beams, spanning multiple industries from semiconductor manufacturing to materials science.

Collaborations

In his professional journey, Xin Man has collaborated with esteemed colleagues, including Tatsuya Asahata and Atsushi Uemoto. These partnerships have fostered innovation and driven the development of cutting-edge technologies that address contemporary challenges in research and industry.

Conclusion

With a trail of patents reflecting his innovative spirit and a career rich in collaboration and technological advancement, Xin Man stands out as a pioneering inventor in the field of charged particle beam technology. His contributions continue to push boundaries and inspire future innovations in imaging and materials analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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