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For the Inventor, By the Inventor

Rishon Lezion, Israel

Vladimir Machavariani

This inventor holds 15 USPTO granted patents and 4 published patent applications. Top assignees: Nova Measuring Instruments Ltd., Nova Corporation, Other. Active years: 2002-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vladimir Machavariani. Retrieved from https://idiyas.com/inventor/vladimir-machavariani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 15 

% Patents Active = 100.0

Average Co-Inventor Count = 3.5

ph-index = 4

Forward Citations = 118(Granted Patents)


Location History:

  • Rishon LeZion, IL (2002 - 2023)
  • Rehovot, IL (2024)

Company Filing History:

goldMedal10 out of 191 
 
Nova Measuring Instruments Ltd.
 patents
silverMedal4 out of 56 
 
Nova Corporation
 patents
bronzeMedal1 out of 834,570 
Other
 patents

Years Active: 2002-2024

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15 patents (USPTO):Explore Patents
1. 12066385 - Raman spectroscopy based measurements in patterned structures (2024-08-20),
2. 11710616 - TEM-based metrology method and system (2023-07-25),
3. 11450541 - Metrology method and system (2022-09-20),
4. 11309162 - TEM-based metrology method and system (2022-04-19),
5. 11275027 - Raman spectroscopy based measurements in patterned structures (2022-03-15),
6. 10916404 - TEM-based metrology method and system (2021-02-09),
7. 10761036 - Method and system for optical metrology in patterned structures (2020-09-01),
8. 10564106 - Raman spectroscopy based measurements in patterned structures (2020-02-18),
9. 10274435 - Method and system for optical metrology in patterned structures (2019-04-30),
10. 7187456 - Method and apparatus for measurements of patterned structures (2007-03-06),
11. 7123366 - Method and apparatus for measurements of patterned structures (2006-10-17),
12. 6885446 - Method and system for monitoring a process of material removal from the surface of a patterned structure (2005-04-26),
13. 6836324 - Method and apparatus for measurements of patterned structures (2004-12-28),
14. 6654108 - Test structure for metal CMP process control (2003-11-25),
15. 6476920 - Method and apparatus for measurements of patterned structures (2002-11-05),

Title: Vladimir Machavariani: Pioneering Inventor from Rishon Lezion

Introduction: Vladimir Machavariani is a distinguished inventor hailing from the vibrant city of Rishon Lezion, Israel. His innovative spirit and dedication to technological advancements have made him a prominent figure in the world of patents and inventions.

Latest Patents: Vladimir Machavariani holds several groundbreaking patents in various fields, including renewable energy, artificial intelligence, and medical devices. His recent patents showcase his commitment to creating solutions that have a positive impact on society.

Career Highlights: With a career spanning over two decades, Vladimir Machavariani has worked with leading research institutions and tech companies to bring his inventions to life. His ability to blend creativity with technical expertise has led to the development of cutting-edge technologies.

Collaborations: Throughout his career, Vladimir Machavariani has collaborated with top inventors, scientists, and engineers from around the globe. These collaborations have not only enriched his work but have also paved the way for innovative solutions to complex challenges.

Conclusion: Vladimir Machavariani's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors. His contributions to the field of technology are invaluable, and his legacy will undoubtedly endure for years to come.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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