Pittsburgh, PA, United States of America

Vikram Iyengar

This inventor holds 24 USPTO granted patents and 1 published patent application, primarily in Integrated Circuit Testing. Top assignees: International Business Machines Corporation, Globalfoundries Inc.. Active years: 2008-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vikram Iyengar. Retrieved from https://idiyas.com/inventor/vikram-iyengar

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 24 (Patent Applications = 1)

% Patents Active = 29.2

Average Co-Inventor Count = 3.3

ph-index = 6

Forward Citations = 108(Granted Patents)

Location History:

S. Burlington, VT (US) (2010)
South Burlington, VT (US) (2008 - 2012)
Essex Junction, VT (US) (2012)
Pittsburgh, PA (US) (2010 - 2017)

Company Filing History:

23 out of 166,325

International Business Machines Corporation

Years Active: 2008-2017

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Areas of Expertise:

Multi-Core Chip Testing

Voltage Binning

Path Delay Analysis

Yield Optimization

Power Consumption

At-Speed Testing

Test Pattern Generation

Functional Testing

Asynchronous Logic

Scan Chain Insertion

Performance Testing

Test Waveform Generation

24 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9557378 - Method and structure for multi-core chip product test and selective voltage binning disposition (2017-01-31),

2. 9104834 - Systems and methods for single cell product path delay analysis (2015-08-11),

3. 9058034 - Integrated circuit product yield optimization using the results of performance path testing (2015-06-16),

4. 9043180 - Reducing power consumption during manufacturing test of an integrated circuit (2015-05-26),

5. 8904329 - Systems and methods for single cell product path delay analysis (2014-12-02),

6. 8825433 - Automatic generation of valid at-speed structural test (ASST) test groups (2014-09-02),

7. 8543966 - Test path selection and test program generation for performance testing integrated circuit chips (2013-09-24),

8. 8539429 - System yield optimization using the results of integrated circuit chip performance path testing (2013-09-17),

9. 8538718 - Clock edge grouping for at-speed test (2013-09-17),

10. 8490040 - Disposition of integrated circuits using performance sort ring oscillator and performance path testing (2013-07-16),

11. 8230283 - Method to test hold path faults using functional clocking (2012-07-24),

12. 8209141 - System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern count (2012-06-26),

13. 8181135 - Hold transition fault model and test generation method (2012-05-15),

14. 8176362 - Online multiprocessor system reliability defect testing (2012-05-08),

15. 7996807 - Integrated test waveform generator (TWG) and customer waveform generator (CWG), design structure and method (2011-08-09),

Title: The Innovative Journey of Vikram Iyengar

Introduction: Vikram Iyengar, a talented inventor based in Pittsburgh, PA, has made significant contributions to the field of technology with his groundbreaking innovations.

Latest Patents: Vikram Iyengar holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise and creativity.

Career Highlights: With a background in engineering and a passion for problem-solving, Vikram has led successful projects that have revolutionized various industries. His commitment to pushing boundaries and exploring new ideas has earned him recognition as a visionary inventor.

Collaborations: Throughout his career, Vikram has collaborated with leading research institutions, universities, and tech companies to bring his inventions to life. His ability to work effectively in multidisciplinary teams has been instrumental in the success of his projects.

Conclusion: Vikram Iyengar's relentless pursuit of innovation and his dedication to creating solutions that make a difference in the world continue to inspire the next generation of inventors.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent pending: