The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Aug. 26, 2009
Robert W. Bassett, Essex Junction, VT (US);
Andrew Ferko, Waterbury, VT (US);
Vikram Iyengar, South Burlington, VT (US);
Robert W. Bassett, Essex Junction, VT (US);
Andrew Ferko, Waterbury, VT (US);
Vikram Iyengar, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Disclosed are embodiments of a system and method for automatically selecting and generating test patterns for an at-speed structural test of an integrated circuit device. Specifically, a test pattern generation pass is started and proceeds until the 'knee' of the simulated test coverage curve is observed. Next, the test patterns are optionally reordered and some are removed. Then, another test pattern generation pass is started. The process is repeated iteratively until some predetermined final stopping criterion is met. By performing multiple test pattern generation passes and reducing the number of available test patterns that can be generated with each pass, the method exploits the initial increase in the test coverage curve inherent in each pass and limits the overall test pattern count.