The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Nov. 11, 2011
Jeanne P. Bickford, Essex Junction, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Vikram Iyengar, Pittsburgh, PA (US);
David E. Lackey, Jericho, VT (US);
Jinjun Xiong, White Plains, NY (US);
Jeanne P. Bickford, Essex Junction, VT (US);
Peter A. Habitz, Hinesburg, VT (US);
Vikram Iyengar, Pittsburgh, PA (US);
David E. Lackey, Jericho, VT (US);
Jinjun Xiong, White Plains, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of test path selection and test program generation for performance testing integrated circuits. The method includes identifying clock domains having multiple data paths of an integrated circuit design having multiple clock domains; selecting, from the data paths, critical paths for each clock domain of the multiple clock domains; using a computer, for each clock domain of the multiple clock domain, selecting the sensitizable paths of the critical paths; for each clock domain of the multiple clock domain, selecting test paths from the sensitizable critical paths; and using a computer, creating a test program to performance test the test paths.