Inventors with similar research interests:
Location History:
- Essex Juntion, VT (US) (2015)
- Essex Junction, VT (US) (2006 - 2020)
Company Filing History:
49 out of 164,197 
21 out of 5,671 
2 out of 672 
Years Active: 2006-2020
Areas of Expertise:
Title: Jeanne P. Bickford: Innovator in Integrated Circuit Reliability
Introduction
Jeanne P. Bickford is a distinguished inventor based in Essex Junction, Vermont, known for her extensive contributions to the field of integrated circuits. With an impressive portfolio of 73 patents, Bickford has made significant advancements in the reliability and performance testing of integrated circuit chips.
Latest Patents
Among her latest innovations is the "Product performance test binning," which focuses on a method and system for significantly enhancing the testing process of integrated circuits. This method includes several steps to optimize the testing of pathways within an integrated circuit chip, ensuring reliable performance under varied electrical conditions. This method first selects a voltage bin with specified frequency ranges and conducts a functional path test on designated data paths. If a pathway fails, the testing voltage is adjusted, and the process repeats until all paths are validated.
Another notable patent from Bickford is the "Integrated circuit chip reliability qualification using a sample-specific expected fail rate." This method revolutionizes how integrated circuit chips are stress-tested and qualified. Instead of using a general overall fail rate, Bickford’s approach calculates a unique expected fail rate for specific samples based on the manufacturing process, contributing to better reliability assessments for IC chips.
Career Highlights
Throughout her career, Bickford has worked with well-respected companies in the technology sector, including International Business Machines Corporation (IBM) and GlobalFoundries Inc. Her experience in these globally recognized organizations has provided her with a platform to innovate and contribute to the development of state-of-the-art integrated circuit technologies.
Collaborations
In her professional journey, Bickford has had the opportunity to work alongside talented individuals such as Nazmul Habib and Susan K. Lichtensteiger. These collaborations have allowed her to expand her expertise and contribute to pivotal projects in integrated circuit development.
Conclusion
Jeanne P. Bickford's commitment to innovation in integrated circuit reliability and performance testing is evident through her impressive patent count and the groundbreaking methods she has developed. As a leading inventor, her work continues to influence the field and pave the way for advancements in technology.