The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Nov. 11, 2011
Applicants:
Theodoros Anemikos, Milton, VT (US);
Jeanne Bickford, Essex Junction, VT (US);
Nazmul Habib, South Burlington, VT (US);
Susan K. Lichtensteiger, Essex Junction, VT (US);
Inventors:
Theodoros Anemikos, Milton, VT (US);
Jeanne Bickford, Essex Junction, VT (US);
Nazmul Habib, South Burlington, VT (US);
Susan K. Lichtensteiger, Essex Junction, VT (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 31/00 (2006.01); G01R 31/14 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31718 (2013.01);
Abstract
A method, test system and computer program product and system for voltage binning integrated circuit chips. The method includes selecting or changing a voltage bin of a set of voltages bins corresponding to frequency specification limits of an integrated circuit chip using functional testing of data paths of the integrated circuit chip.