Jericho, VT, United States of America

David E Lackey

USPTO Granted Patents = 45 


Average Co-Inventor Count = 2.9

ph-index = 12

Forward Citations = 620(Granted Patents)


Location History:

  • Poughkeepsie, NY (US) (1992)
  • Underhill, VT (US) (1998)
  • Essex Junction, VT (US) (2011 - 2012)
  • Jericho, VT (US) (2001 - 2013)

Company Filing History:


Years Active: 1992-2013

where 'Filed Patents' based on already Granted Patents

45 patents (USPTO):

Title: The Innovative Contributions of David E. Lackey in Integrated Circuit Technology

Introduction: David E. Lackey, an accomplished inventor based in Jericho, Vermont, has made substantial contributions to the field of integrated circuit technology, holding 45 patents to his name. His work demonstrates a commitment to advancing the precision and reliability of electronic systems through innovative approaches.

Latest Patents: Among his latest patents, Lackey has developed a “Method and device for selectively adding timing margin in an integrated circuit.” This invention incorporates a method, system, and integrated circuit that allows for selectively added timing margin during the design process. By identifying paths that are not robustly tested at speed, optimizing chip logic, and updating specifications, the method enhances the manufacturing test processes. Another significant patent is for “Test path selection and test program generation for performance testing integrated circuit chips.” This patent details a systematic approach for identifying clock domains and critical paths to create effective test programs for performance evaluation, ensuring that integrated circuits can meet the necessary performance standards.

Career Highlights: David E. Lackey is a key contributor at International Business Machines Corporation (IBM), where he has engaged in significant research and development projects. His extensive work in integrating statistical timing with automatic test pattern generation showcases his dedication to fostering innovations that improve manufacturing testing processes.

Collaborations: Throughout his career, Lackey has collaborated with notable colleagues such as Steven Frederick Oakland and Paul Steven Zuchowski. These partnerships have undoubtedly propelled forward many advancements in integrated circuit technologies and testing methodologies through shared knowledge and expertise.

Conclusion: David E. Lackey’s impressive portfolio of patents and his commitment to innovative solutions highlight his influential role in the integrated circuit industry. His work not only sets standards for performance testing but also pushes the boundaries of what is possible in electronic design. With continued innovations, Lackey remains a prominent figure in shaping the future of integrated circuits.

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