The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2014

Filed:

Jan. 07, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jeanne P. Bickford, Essex Junction, VT (US);

Peter A. Habitz, Hinesburg, VT (US);

Vikram Iyengar, Pittsburgh, PA (US);

Brian A. Worth, Jericho, VT (US);

Jinjun Xiong, White Plains, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5009 (2013.01);
Abstract

Methods and systems for qualifying a single cell with product path delay analysis are provided. A method includes designing a product using a model from an initial test site. The method also includes creating performance path tests for one or more paths on the product. The method further includes measuring performance path parameters of the product. The method includes determining that the measured performance path parameters match predicted performance path parameters.


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