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For the Inventor, By the Inventor

Milpitas, CA, United States of America

V Swamy Irrinki

USPTO Granted Patents = 20

Average Co-Inventor Count = 2.9

ph-index = 15

Forward Citations = 1,095(Granted Patents)


Company Filing History:

goldMedal20 out of 3,715 
 
Lsi Logic Corporation
 patents
silverMedal2 out of 5 
 
Heuristic Physics Laboratories
 patents
where one patent can have more than one assignee

Years Active: 1998-2004

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20 patents (USPTO):Explore Patents
1. 6757854 - Detecting faults in dual port FIFO memories (2004-06-29),
2. 6681358 - Parallel testing of a multiport memory (2004-01-20),
3. 6671842 - Asynchronous bist for embedded multiport memories (2003-12-30),
4. 6574762 - Use of a scan chain for configuration of BIST unit operation (2003-06-03),
5. 6550032 - Detecting interport faults in multiport static memories (2003-04-15),
6. 6496950 - Testing content addressable static memories (2002-12-17),
7. 6367042 - Testing methodology for embedded memories using built-in self repair and identification circuitry (2002-04-02),
8. 6255836 - Built-in self-test unit having a reconfigurable data retention test (2001-07-03),
9. 6101458 - Automatic ranging apparatus and method for precise integrated circuit (2000-08-08),
10. 6067262 - Redundancy analysis for embedded memories with built-in self test and (2000-05-23),
11. 6061814 - Test circuitry for determining the defect density of a semiconductor (2000-05-09),
12. 5987632 - Method of testing memory operations employing self-repair circuitry and (1999-11-16),
13. 5982659 - Memory cell capable of storing more than two logic states by using (1999-11-09),
14. 5956350 - Built in self repair for DRAMs using on-chip temperature sensing and (1999-09-21),
15. 5867423 - Memory circuit and method for multivalued logic storage by process (1999-02-02),

Title: Innovations and Contributions of V Swamy Irrinki

Introduction: V Swamy Irrinki, an accomplished inventor based in Milpitas, CA, holds an impressive portfolio of 20 patents. His work primarily focuses on advancements in memory technologies, particularly in fault detection and built-in self-test (BIST) methods for multiport memories.

Latest Patents: Among his latest patents, Irrinki has developed significant techniques for enhancing memory reliability. One notable invention is titled "Detecting faults in dual port FIFO memories." This efficient and reliable technique aims to identify faults in FIFO systems, encompassing both control faults unique to FIFO mechanisms and common faults found in traditional memories. This invention cleverly avoids the need to directly monitor internal FIFO values by implementing a series of read, write, and control operations.

Another groundbreaking patent is for "Parallel testing of a multiport memory," which introduces a multiport BIST method and apparatus. This method innovatively adapts a single port BIST technology by categorizing memory into sections relative to the number of ports and executing simultaneous tests across all ports. An example from this invention describes how a multiport memory integrates a BIST unit that simultaneously applies different test patterns to its ports, ensuring the systematic evaluation of memory sections while maintaining operational efficiency.

Career Highlights: V Swamy Irrinki has made significant contributions to memory technology through his work at prominent companies such as LSI Logic Corporation and Heuristic Physics Laboratories. His expertise has paved the way for innovative solutions that address pressing challenges in the field of digital memory systems.

Collaborations: Throughout his career, Irrinki has collaborated with notable professionals, including Thomas R. Wik and Ashok K. Kapoor. These partnerships have further fueled his innovative spirit and contributed to the development of cutting-edge memory technologies.

Conclusion: V Swamy Irrinki's contributions to the field of memory technology, exemplified by his extensive patent portfolio and significant collaborations, reflect his dedication to innovation. His work in fault detection and testing methods has not only advanced technical understanding but has also paved the way for future innovations in memory systems.

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