The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2000
Filed:
Dec. 11, 1998
V Swamy Irrinki, Milpitas, CA (US);
Tuan L Phan, San Jose, CA (US);
William D Schwarz, San Jose, CA (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
An efficient methodology for detecting and rejecting faulty integrated circuits with embedded memories utilizing stress factors during the manufacturing production testing process. In the disclosed embodiment of the invention, a stress factor is applied to an integrated circuit having built-in-self-test (BIST) circuitry and built-in-self-repair (BISR) circuitry. A BIST run is then performed on a predetermined portion of the integrated circuit to detect a set of faulty memory locations. The results of this first BIST run are stored. A second condition is applied to the die and a second BIST run is executed to generate a second set of faulty memory locations. The results of the second BIST run are stored and compared with the first result. If the results differ, the integrated circuit is rejected. Thus, a methodology for screening out field errors at the factory is disclosed using BIST/BISR circuitry.