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William D Schwarz

USPTO Granted Patents = 14 (Patent Applications = 1)

Average Co-Inventor Count = 1.6

ph-index = 11

Forward Citations = 563(Granted Patents)

Location History:

San Leandro, CA (US) (1998 - 1999)
San Jose, CA (US) (2000 - 2004)
Austin, TX (US) (2006 - 2014)

Company Filing History:

10 out of 3,715

Lsi Logic Corporation

Freescale Semiconductor,inc.

Years Active: 1998-2025

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14 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12316483 - Encoding and decoding for PAM transmitter and receiver (2025-05-27),

2. 8700878 - Event triggered memory mapped access (2014-04-15),

3. 7493541 - Method and system for performing built-in-self-test routines using an accumulator to store fault information (2009-02-17),

4. 7260758 - Method and system for performing built-in self-test routines using an accumulator to store fault information (2007-08-21),

5. 7076699 - Method for testing semiconductor devices having built-in self repair (BISR) memory (2006-07-11),

6. 6795942 - Built-in redundancy analysis for memories with row and column repair (2004-09-21),

7. 6505313 - Multi-condition BISR test mode for memories with redundancy (2003-01-07),

8. 6505308 - Fast built-in self-repair circuit (2003-01-07),

9. 6496947 - Built-in self repair circuit with pause for data retention coverage (2002-12-17),

10. 6255836 - Built-in self-test unit having a reconfigurable data retention test (2001-07-03),

11. 6067262 - Redundancy analysis for embedded memories with built-in self test and (2000-05-23),

12. 5982681 - Reconfigurable built-in self test circuit (1999-11-09),

13. 5909404 - Refresh sampling built-in self test and repair circuit (1999-06-01),

14. 5835429 - Data retention weak write circuit and method of using same (1998-11-10),

As an AI assistant specialized in innovations, inventions, inventors, patent attorneys, assignees, and patents, I can provide information on inventor William D Schwarz.

Title: Inventor Spotlight: William D Schwarz

Introduction: William D Schwarz is a prolific inventor based in Austin, TX, with an impressive track record of 13 patents to his name.

Latest Patents:

1. Event triggered memory mapped access: Involves a data processing system with a triggered memory map access system, capable of performing various actions based on received events.

2. Method and system for performing built-in-self-test routines: Introduces a test system with a built-in self-test circuit and stress applicator for analyzing memory arrays under different stress conditions.

Career Highlights: William D Schwarz has made significant contributions to the field of data processing and memory testing. He has worked with companies like LSI Logic Corporation and LSI Corporation, where he showcased his expertise in developing innovative solutions.

Collaborations: During his career, William D Schwarz collaborated with esteemed professionals such as Ghasi R Agrawal and Mukesh K Puri, further enriching his inventions with collective knowledge and expertise.

Conclusion: William D Schwarz stands out as a trailblazing inventor in the realm of data processing and memory testing. His patents reflect his commitment to innovation and his ability to address complex technological challenges with creative solutions.

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