The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2000

Filed:

Oct. 30, 1997
Applicant:
Inventors:

Emery Sugasawara, Pleasanton, CA (US);

V Swamy Irrinki, Milpitas, CA (US);

Sudhakar R Gouravaram, Fremont, CA (US);

Assignee:

LSI Logic, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
702119 ; 702117 ; 324763 ; 324765 ; 714734 ;
Abstract

A computer-based test method and apparatus for measuring DC current drawn by an integrated circuit. The apparatus has a plurality of current measurement ranges and is first initialized to a selected one of the measurement ranges. Next, the apparatus measures the DC current drawn by the integrated circuit in the selected measurement range and increments the selected measurement range if the measured DC current is out of the selected measurement range. The apparatus repeats the steps of measuring and incrementing until the measured DC current is in the selected measurement range. The measured DC current is then compared to a specification limit for the integrated circuit.


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