logo

For the Inventor, By the Inventor

Tokyo, Japan

Tsunenori Nomaguchi

This inventor holds 27 USPTO granted patents and 8 published patent applications and 1 EPO patent, primarily in Charged Particle Beams. Top assignees: Hitachi High-Tech Corporation, Hitachi-High-Technologies Corporation, Japan Fine Ceramics Center. Active years: 2013-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsunenori Nomaguchi. Retrieved from https://idiyas.com/inventor/tsunenori-nomaguchi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 27 

% Patents Active = 88.9

 

Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 13(Granted Patents)


Location History:

  • Hitachinaka, JP (2013)
  • Tokyo, JP (2016 - 2023)

Company Filing History:

goldMedal18 out of 1,380 
 
Hitachi High-Tech Corporation
 patents
silverMedal9 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
bronzeMedal3 out of 45 
 
Japan Fine Ceramics Center
 patents
where one patent can have more than one assignee

Years Active: 2013-2026

Loading Chart...
Loading Chart...
Areas of Expertise:
Charged Particle Beam
Semiconductor Analysis
Electron Beam Apparatus
Particle Measuring Device
Lamella Production
Sample Thickness Measurement
Scanning Electron Microscope
Composite Charged Particle Detector
Angle Adjustment Mechanism
Observation Method
Conveyance Device
Analysis System
27 patents (USPTO):Explore Patents
1. 12586751 - Transfer device and analysis system (2026-03-24),
2. 12436114 - Semiconductor analysis system (2025-10-07),
3. 12374520 - Tweezers, conveyance device, and method for conveying sample piece (2025-07-29),
4. 12347707 - Semiconductor analysis system (2025-07-01),
5. 12176180 - Method for producing lamella, analysis system and method for analyzing sample (2024-12-24),
6. 12119202 - Mechanism for adjusting angle of incidence on charged particle beam aperture, and charged particle beam device (2024-10-15),
7. 11817289 - Charged particle beam device (2023-11-14),
8. 11798776 - Charged particle beam apparatus (2023-10-24),
9. 11784022 - Electron beam apparatus (2023-10-10),
10. 11640897 - Charged particle beam device (2023-05-02),
11. 11430630 - Charged particle beam apparatus (2022-08-30),
12. 11335532 - Charged particle beam device (2022-05-17),
13. 11268915 - Charged particle beam device, method for processing sample, and observation method (2022-03-08),
14. 11264201 - Charged particle beam device (2022-03-01),
15. 11183359 - Charged particle beam apparatus (2021-11-23),

Title: Tsunenori Nomaguchi - Pioneering Inventor from Tokyo, JP

Introduction: Tsunenori Nomaguchi is a renowned inventor hailing from the vibrant city of Tokyo, Japan. With a passion for innovation and a keen eye for detail, he has made significant contributions to the field of technology through his groundbreaking inventions.

Latest Patents: Tsunenori Nomaguchi holds several patents in the areas of robotics, artificial intelligence, and renewable energy. His most recent patents focus on enhancing efficiency in industrial processes and improving sustainability in urban environments.

Career Highlights: Throughout his illustrious career, Tsunenori Nomaguchi has worked with leading tech companies in Japan, spearheading research and development projects that have pushed the boundaries of technological advancement. His innovative solutions have garnered international recognition and praise.

Collaborations: Tsunenori Nomaguchi has collaborated with top researchers, engineers, and scientists from around the world to bring his inventions to life. His ability to work in multidisciplinary teams has led to the successful implementation of cutting-edge technologies in various industries.

Conclusion: In conclusion, Tsunenori Nomaguchi stands as a visionary inventor whose dedication to innovation has reshaped the technological landscape. His pioneering spirit and relentless pursuit of excellence continue to inspire the next generation of inventors worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…