The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

May. 01, 2020
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Naoki Samura, Tokyo, JP;

Tsunenori Nomaguchi, Tokyo, JP;

Shinsuke Kawanishi, Tokyo, JP;

Yaku Maeda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); H01J 37/244 (2006.01); H01J 37/30 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); H01J 37/244 (2013.01); H01J 37/3005 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/208 (2013.01); H01J 2237/31749 (2013.01);
Abstract

Tweezers, which can grip a sample piece, includes a gripping memberand a gripping member. The gripping memberincludes a gripping regionand an abutment region, and the gripping memberincludes a gripping regionand an abutment region. The gripping regionand the gripping regioninclude a gripping surface SFand a gripping surface SFfor gripping the sample piece, respectively. The abutment regionprotrudes from the gripping regionin a direction directed from the gripping surface SFto the gripping surface SF, and the abutment regionprotrudes from the gripping regionin a direction directed from the gripping surface SFto the gripping surface SF


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