Tokyo, Japan

Shinsuke Kawanishi

This inventor holds 22 USPTO granted patents and 3 published patent applications and 2 EPO patents, primarily in Charged Particle Beam Technology. Top assignees: Hitachi-High-Technologies Corporation, Hitachi High-Tech Corporation. Active years: 2015-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shinsuke Kawanishi. Retrieved from https://idiyas.com/inventor/shinsuke-kawanishi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 22 

% Patents Active = 59.1

 

Average Co-Inventor Count = 3.5

ph-index = 3

Forward Citations = 22(Granted Patents)


Location History:

  • Hitachinaka, JP (2015)
  • Tokyo, JP (2015 - 2018)

Company Filing History:


Years Active: 2015-2025

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Areas of Expertise:
Charged Particle Beam
Electron Microscope
Image Generation
Sample Observation
Inspection Apparatus
Sample Stage Unit
Diaphragm Mounting
Specimen-Image Acquisition
Optical Axis Adjustment
Storage Container
Thin Membrane Holder
Conveyance Device
22 patents (USPTO):Explore Patents

Title: The Innovative Mind of Shinsuke Kawanishi

Introduction:

Shinsuke Kawanishi, based in Tokyo, Japan, is a prominent inventor known for his significant contributions to the field of scanning electron microscopy. With an impressive portfolio comprising 21 patents, Kawanishi has established himself as a key figure within the technological advancements fostered by Hitachi High-Technologies Corporation.

Latest Patents:

Among Kawanishi's latest innovations are two groundbreaking patents. The first is an Electron Scanning Microscope and Image Generation Method, which introduces an innovative isolation film. This film effectively separates an atmospheric pressure space, containing the specimen, from a vacuum space located on the charged particle optical system side. It ensures that the electron optical lens barrel can radiate a primary electron beam onto the specimen while maintaining a lower vacuum state around the chassis during operation. The design allows for more precise imaging and study of materials at the micro and nanoscale.

The second recent patent is a Method for Adjusting Height of Sample and Observation System. This invention addresses a common limitation faced in charged particle microscopy regarding the distance between the diaphragm and the sample. By incorporating a height adjustment member, the position of the diaphragm can be precisely controlled, facilitating safe and efficient adjustments of the sample height. This advancement aims to streamline the observation process and enhance the accuracy of imaging.

Career Highlights:

Shinsuke Kawanishi has dedicated his career to advancing microscopy technology at Hitachi High-Technologies Corporation. His work has played an integral role in enhancing imaging techniques and functionalities in various scientific fields. His patents not only illustrate a commitment to innovation but also reflect the ongoing pursuit of excellence in microscopy.

Collaborations:

Throughout his career, Kawanishi has collaborated with notable colleagues, including Yusuke Ominami and Hiroyuki Suzuki. These collaborations foster a creative environment that is essential for pushing the boundaries of microscopy and creating solutions that are both functional and cutting-edge.

Conclusion:

Shinsuke Kawanishi stands out as a leading inventor in the field of scanning electron microscopy, with a remarkable number of patents that showcase his dedication to innovation. His recent inventions are set to advance not only scientific research but also various industrial applications. As a member of Hitachi High-Technologies Corporation, he continues to influence the way we observe and analyze materials at microscopic levels, paving the way for future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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