The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2026
Filed:
Apr. 15, 2020
Applicant:
Hitachi High-tech Corporation, Tokyo, JP;
Inventors:
Assignee:
Hitachi High-Tech Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); H01J 37/22 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); H01J 37/222 (2013.01); H01J 37/244 (2013.01);
Abstract
Provided is a technique capable of shortening observation throughput of a sample. A transfer deviceincludes a holderconfigured to hold a mesh MS on which a sample to be analyzed using a charged particle beam deviceis mounted, a position information acquisition function configured to acquire first information about a positional relationship between the mesh MS and the holder, and a position information output function configured to output the first information to the charged particle beam device
Kobayashi, Naofumi. (2026). Transfer device and analysis system (U.S. Patent No. 12586751). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12586751
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile