Fremont, CA, United States of America

Tao Luo

USPTO Granted Patents = 14 

Average Co-Inventor Count = 4.8

ph-index = 5

Forward Citations = 142(Granted Patents)


Company Filing History:


Years Active: 2011-2023

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14 patents (USPTO):

Title: Tao Luo: A Pioneer in Defect Detection and Flexible Region Definition

Introduction:

In the world of innovations and patents, Tao Luo, hailing from Fremont, CA, has made significant contributions in the field of inspection and imaging systems. With a remarkable portfolio of patents and invaluable expertise, Tao Luo has revolutionized defect detection methods and advancements in flexible region definition. Let's delve into his latest patents, career highlights, and collaborations in this article.

Latest Patents:

Tao Luo's innovative mind has resulted in the creation of several groundbreaking patents. Two of his latest patents include:

1. "Inspection of Noisy Patterned Features": This patent introduces methods and systems for detecting defects on a specimen. By analyzing images of the specimen, specifically patterned features, Tao Luo's invention can effectively identify defect candidates. Through the analysis of characteristic differences between pixels, defects are detected, aiding in precision inspection systems.

2. "System and Method for Defining Flexible Regions on a Sample During Inspection": This patent focuses on a system capable of defining flexible regions on a sample. By leveraging median reference die (MRD) images, Tao Luo's invention enables the identification and positioning of flexible region masks. This method greatly enhances inspection accuracy and efficiency.

Career Highlights:

Tao Luo's impressive career highlights are testament to his expertise and commitment to innovation. Some of the noteworthy companies he has worked for include KLA-Tencor Corporation and KLA Corporation. Both companies are renowned in the semiconductor equipment sector, specializing in inspection and measurement systems. During his tenure at these companies, Tao Luo's contributions have greatly advanced defect detection methodologies and inspection technologies.

Collaborations:

Throughout his career, Tao Luo has collaborated with exceptional professionals, amplifying his impact within the industry. Notably, he has worked closely with colleagues such as Lisheng Gao and Yong Zhang. Leveraging their collective knowledge and expertise, Tao Luo and his collaborators have pushed the boundaries of inspection and imaging technologies, resulting in significant advancements.

Conclusion:

Tao Luo's passion for innovation and commitment to improving defect detection and flexible region definition has undoubtedly made a lasting impact on the industry. With 14 patents to his name, his contributions have paved the way for more accurate inspection systems and enhanced manufacturing processes. Going forward, it will be exciting to see how Tao Luo continues to push the boundaries of technological advancements in the realm of inspection and imaging systems.

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