Tokyo, Japan

Takenori Hirose

USPTO Granted Patents = 25 

Average Co-Inventor Count = 3.9

ph-index = 6

Forward Citations = 185(Granted Patents)


Location History:

  • Machida, JP (2004 - 2007)
  • Yokohama, JP (2004 - 2013)
  • Tokyo, JP (2013 - 2023)

Company Filing History:


Years Active: 2004-2025

where 'Filed Patents' based on already Granted Patents

25 patents (USPTO):

Title: Spotlight on Inventor Takenori Hirose: Enhancing Measurement Sensitivity Through Innovation

Introduction: Takenori Hirose, a prolific inventor based in Tokyo, Japan, has made significant contributions to the field of microscopy and precision measurement through his innovative patents and research endeavors.

Latest Patents: Among his 23 patents, Takenori Hirose's latest innovations include a Cantilever, a Scanning Probe Microscope, and a Measurement Method using a Scanning Probe Microscope. These patents focus on enhancing the measurement sensitivity of a scanning probe microscope by incorporating advanced features such as metallic film coatings and precise light irradiation techniques.

Career Highlights: Hirose has established himself as a visionary in the industry, having worked with renowned companies such as Hitachi Co., Ltd and Hitachi High-Technologies Corporation. His expertise and dedication to pushing the boundaries of technology have led to groundbreaking advancements in microscopy and measurement devices.

Collaborations: Throughout his career, Hirose has collaborated with esteemed colleagues such as Mineo Nomoto and Hideaki Sasazawa. Together, they have synergized their skills and knowledge to develop cutting-edge solutions that address the intricacies of pattern height measurement and charged particle beam devices.

Conclusion: Takenori Hirose's trailblazing work in the realm of microscopy and precision measurement is a testament to his ingenuity and commitment to innovation. His latest patents and collaborations underscore his position as a leading figure in the field, shaping the future of scientific instrumentation and measurement techniques for years to come.

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