The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2013
Filed:
May. 03, 2012
Kaifeng Zhang, Yokohama, JP;
Takenori Hirose, Tokyo, JP;
Masahiro Watanabe, Yokohama, JP;
Tetsuya Matsui, Hitachi, JP;
Tsuneo Nakagomi, Nakai, JP;
Teruaki Tokutomi, Odawara, JP;
Kaifeng Zhang, Yokohama, JP;
Takenori Hirose, Tokyo, JP;
Masahiro Watanabe, Yokohama, JP;
Tetsuya Matsui, Hitachi, JP;
Tsuneo Nakagomi, Nakai, JP;
Teruaki Tokutomi, Odawara, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
In a method of manufacturing this cantilever for the magnetic force microscope, a magnetic film is formed on a probe at a tip of the cantilever for the magnetic force microscope. When a non-magnetic rigid protective film is formed around the probe, the film is formed from the front of the probe of the cantilever for the magnetic force microscope at an angle (15° to 45°) and from the back of the probe of the cantilever for the magnetic force microscope in two directions each at an angle in a range of (15° to 30°).