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For the Inventor, By the Inventor

Sagamihara, Japan

Takashi Yoneyama

This inventor holds 38 USPTO granted patents and 1 published patent application and 7 EPO patents, primarily in Microscope Technology. Top assignees: Olympus Corporation, Fuji Photo Film Company, Limited, Olympus Optical Company, Ltd.. Active years: 1985-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takashi Yoneyama. Retrieved from https://idiyas.com/inventor/takashi-yoneyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 38 

% Patents Active = 76.3

 

Average Co-Inventor Count = 2.8

ph-index = 11

Forward Citations = 307(Granted Patents)


Location History:

  • Hachioji, JP (1999 - 2001)
  • Kanagawa, JP (1985 - 2014)
  • Sagamihara, JP (2000 - 2014)
  • Tokyo, JP (2008 - 2024)

Company Filing History:

goldMedal17 out of 8,306 
 
Olympus Corporation
 patents
silverMedal10 out of 16,458 
 
Fuji Photo Film Company, Limited
 patents
bronzeMedal8 out of 5,729 
 
Olympus Optical Company, Ltd.
 patents
4. 2 out of 97 
 
Evident Corporation
 patents
5. 1 out of 16,339 
 
E.i. Dupont De Nemours and Company
 patents

Years Active: 1985-2024

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Areas of Expertise:
Microscope System
Image Projection
Virtual-Slide Device
Photomicroscopy
Automatic Exposure
Defect Inspection
Focus Detection
Optical Apparatus
Focal Depth Expansion
Chromatic Aberration
Image Synthesis
Photo-Sensitive Materials
38 patents (USPTO):Explore Patents
1. 11869166 - Microscope system, projection unit, and image projection method (2024-01-09),
2. 11594051 - Microscope system and projection unit (2023-02-28),
3. 8890947 - Microscope apparatus and method for image acquisition of specimen slides having scattered specimens (2014-11-18),
4. 8837676 - Virtual-slide creating device (2014-09-16),
5. 8730315 - Microscope apparatus and microscope observation method (2014-05-20),
6. 8723942 - Photomicroscopy system, image input device, and automatic exposure method (2014-05-13),
7. 8284246 - Microscope system, control method used for microscope system, and recording medium for reproducing a microscope state based on microscope operation history and a microscope operation item (2012-10-09),
8. 8264768 - Microscope system (2012-09-11),
9. 8014579 - Microscope system and method for synthesizing microscopic images (2011-09-06),
10. 7949161 - Microscope system and method for synthesizing microscopic images (2011-05-24),
11. 7929738 - Microscope apparatus and microscope system (2011-04-19),
12. 7756357 - Microscope system for obtaining high and low magnification images (2010-07-13),
13. 7706597 - Defect inspection apparatus and defect inspection method (2010-04-27),
14. 7612316 - Focus detection device and fluorescent observation device using the same (2009-11-03),
15. D595327 - Microscope (2009-06-30),

Title: The Innovative Journey of Takashi Yoneyama

Introduction: Takashi Yoneyama is a pioneering inventor hailing from Sagamihara, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Takashi Yoneyama holds several patents in the realm of robotics and artificial intelligence, with his most recent inventions focusing on advanced human-machine interfaces and autonomous systems.

Career Highlights: With a career spanning over two decades, Yoneyama has worked with leading tech companies in Japan, spearheading research and development projects that have pushed the boundaries of technological innovation.

Collaborations: Throughout his career, Takashi Yoneyama has collaborated with top researchers and engineers in the industry, fostering a culture of innovation and knowledge-sharing that has led to the creation of cutting-edge technologies.

Conclusion: Takashi Yoneyama's relentless pursuit of innovation and his passion for pushing the limits of technology have solidified his reputation as a visionary inventor in the field of robotics and artificial intelligence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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