The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 19, 2011

Filed:

Oct. 10, 2006
Applicants:

Tetsuya Shirota, Tokyo, JP;

Yasuko Ishii, Tokyo, JP;

Takashi Yoneyama, Sagamihara, JP;

Inventors:

Tetsuya Shirota, Tokyo, JP;

Yasuko Ishii, Tokyo, JP;

Takashi Yoneyama, Sagamihara, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope apparatus includes a capture unit for capturing a microscopic image of a specimen in a predetermined microscopy, a capture control unit controlling the capture unit and capturing a microscopic image about the same specimen with a plurality of predetermined resolutions, and a microscopy switch unit switching the microscopy. With the configuration, the capture control unit at least includes a first capture control unit allowing the capture unit to capture the specimen with a first resolution controlled in advance, a definition unit defining a plurality of small sections obtained by dividing a first microscopic image captured by the capture unit under control of the first capture control unit; and a second capture control unit allowing the capture unit to capture a portion corresponding to the small section of the specimen with a predetermined second resolution as a resolution higher than the first resolution.


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