The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Jun. 03, 2008
Hideyuki Kawanabe, Tokyo, JP;
Tetsuya Shirota, Tokyo, JP;
Yasuko Ishii, Tokyo, JP;
Takashi Yoneyama, Sagamihara, JP;
Hideyuki Kawanabe, Tokyo, JP;
Tetsuya Shirota, Tokyo, JP;
Yasuko Ishii, Tokyo, JP;
Takashi Yoneyama, Sagamihara, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A microscope system that is capable of changing a status of observation of a sample comprises an instruction unit for giving instruction for driving one or more optical members including an objective lens or for changing a relative position of the sample and the objective lens; and an image capturing unit for capturing an observed image of the sample as a still image or a live image. The microscope system changes an order for performing operations in accordance with the instruction from the instruction unit, the operations including an operation of driving the one or more optical members or changing the relative position; an operation of switching the illumination light for the sample from being cut-off or reduced to being applied; and an operation of switching the image displayed in a display unit from the still image to the live image.