The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2014
Filed:
Jun. 14, 2011
Takashi Yoneyama, Tokyo, JP;
Chika Nakajima, Tokyo, JP;
Takashi Yoneyama, Tokyo, JP;
Chika Nakajima, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
Provided is a microscope apparatus including a macro-image, acquisition section that acquires a macro image of a glass slide having a specimen mounted thereon; an extraction section that extracts the specimen in the acquired macro image; a block setting section that sets, when the extracted specimen is scattered to form a plurality of lumps, a plurality of blocks that include the lumps of the specimen; an area dividing section that divides an area that includes the specimen in each of the blocks into a plurality of small regions; and a micro-image acquisition section that acquires, for each of the small regions, a micro image while performing an automatic focusing operation for the specimen in the small region, in which the micro-image acquisition section searches for an autofocusing in-focus position in each of the blocks set by the block setting section.